This is a demonstration of the operation of an FEI Tecnai F20 scanning/transmission electron microscope by Dr. Nicholas Rudawski of the University of Florida; this demonstration covers basic operation in TEM (conventional) mode including:

1. Loading/unloading of a holder from the column
2. Loading/unloading of a grid from the single tilt holder
3. Navigation using the stage controls/finding an area of interest
4. Basic alignment in TEM mode
5. Acquiring an image using the digital camera
6. Effect of numerical value of spot size on beam current/probe size